Photoelectron spectroscopy as a non-invasive method to monitor SASE-FEL spectra

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Published 8 February 2008 Published under licence by IOP Publishing Ltd
, , Citation M Wellhöfer et al 2008 JINST 3 P02003 DOI 10.1088/1748-0221/3/02/P02003

1748-0221/3/02/P02003

Abstract

Since the summer of 2005, the vacuum ultra-violet Free-electron LASer in Hamburg (FLASH) has operated as a user facility at the Deutsches Elektronen-Synchrotron (DESY), delivering ultra-short laser pulses of tens of femtosecond duration with a high peak brilliance of up to 1028 photons/(s mm2 mrad2 0.1% bandwidth). Due to the statistics of the Self-Amplified Spontaneous Emission (SASE) process, each photon pulse differs from the previous one in the number of modes per pulse, the wavelength (0.5% fluctuations) and the intensity, making experiments more complicated. Thus, for certain experiments the detailed knowledge of the beam properties on a shot-to-shot basis is mandatory. In this paper we describe an online method to gain spectral information about the individual Free-Electron Laser (FEL) pulses that is based on rare-gas photoionization and photoelectron spectroscopy.

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10.1088/1748-0221/3/02/P02003