Abstract
The following paper presents a new 2-D detector (`GEMpix') in the soft X-ray range, having a wide dynamic range thanks to its intrisic gain, working in charge integration mode to be used for diagnosing laser produced plasma (LPP) or X-ray pulsed sources. It is a gas detector based on the Gas Electron Multiplier (GEM) technology with a quad-medipix chip as read-out electronics. In our prototype, the substitution of semiconductor material with a gas triple-GEM allows several advantages with respect to the detectors commonly used in LPP, as X-ray CCDs and Micro Channel Plates or Image Plates. In these experiments the configuration Time-over-Threshold (ToT) has been used, to measure the total charge released to the gas and collected by each pixel, integrated over the X-ray burst duration. Intensity response and spatial resolution has been measured first in laboratory for calibration, as function of the voltage applied to the GEMs, in single photon regime with energies between 3.7 and 17 keV. Subsequently it has been tested at the ABC laser facility (ENEA, Frascati). In this case, we measured the X-rays produced when the ABC neodymium laser, with pulse of 50 J and 3 ns time width, hits plane targets of aluminum. 2-D images have been acquired by means of a pinhole configuration with magnification 1.5 and 50 μ m of spatial resolution. The results are encouraging regarding the capability of this imaging detector to work in experiments where soft X-ray emissivity varies over many orders of magnitude.