Nigel G Adams et al 2009 J. Phys.: Conf. Ser. 192 012004 doi:10.1088/1742-6596/192/1/012004
Nigel G Adams, Chris D Molek and Jason L McLain
Show affiliationsThere are discrepancies in the literature for the product distributions of electron-ion (e-i) recombination when determined using different techniques. Because of this, a new technique has been developed. This is based on the flowing afterglow, with the product neutrals detected by electron impact ionization followed by mass spectrometric detection. However, in addition to the products of recombination, there are neutrals present from ion-molecule reactions and from the gases introduced into the flow tube to create the ion of interest, which often have much greater concentrations than the products. To distinguish these products, an electron attaching gas is pulsed into the flow to transiently attach the electrons, thus quenching e-i recombination. Then the difference between the attaching gas in and out yields the product distribution. Recombination products have been detected even when their signal is as much as ~ 104 less than background. Here the details of the technique are described and the possible sources of error discussed. The viability of the technique is illustrated for the recombinations of CH5+ and N2H+. The latter establishes the major product as N2 + H (95 to 100%) correcting an error in the literature. In the former case, the major channel detected is CH4 + H (95%) which is in disagreement with a storage ring (SR) result which gave CH3 as the major channel (68%). Possible reasons for this are discussed.
34.80.Lx Recombination, attachment, and positronium formation
34.80.Gs Molecular excitation and ionization
34.80.Ht Dissociation and dissociative attachment
82.30.Fi Ion-molecule, ion-ion, and charge-transfer reactions
Issue 1 (2009)
Nigel G Adams et al 2009 J. Phys.: Conf. Ser. 192 012004
Tatsuma Nishioka 2009 Class. Quantum Grav. 26 242001
S Fritzsche et al 2008 J. Phys. B: At. Mol. Opt. Phys. 41 165601
C Yang et al 2009 J. Phys. D: Appl. Phys. 42 152002
M T Batchelor et al 2008 J. Phys. A: Math. Theor. 41 352002
Elijah Flenner and Grzegorz Szamel 2007 J. Phys.: Condens. Matter 19 205125
L Kaufner et al 2007 Nanotechnology 18 115710
Jonathan R Gair and Edward K Porter 2009 Class. Quantum Grav. 26 225004
M V Berry and P Shukla 2009 J. Phys. A: Math. Theor. 42 485102
A M Reynolds 2009 J. Phys. A: Math. Theor. 42 434006