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In-situ Scanning Transmission X-ray Microscopy of catalytic materials under reaction conditions

Emiel de Smit1, J Fredrik Creemer2, Henny W Zandbergen3, Bert M Weckhuysen1 and Frank M F de Groot1

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In-situ Scanning X-ray Transmission Microscopy (STXM) allows the measurement of the soft X-ray absorption spectra with 10 to 30 nm spatial resolution under realistic reaction conditions. We show that STXM-XAS in combination with a micromachined nanoreactor can image a catalytic system under relevant reaction conditions, and provide detailed information on the morphology and composition of the catalyst material. The nanometer resolution combined with powerful chemical speciation by XAS and the ability to image materials under realistic conditions opens up new opportunities to study many chemical processes.


PACS

82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces

82.80.Ej X-ray, Mössbauer, and other gamma-ray spectroscopic analysis methods

61.46.Df Structure of nanocrystals and nanoparticles ("colloidal" quantum dots but not gate-isolated embedded quantum dots)

78.70.Dm X-ray absorption spectra

Subjects

Condensed matter: electrical, magnetic and optical

Surfaces, interfaces and thin films

Nanoscale science and low-D systems

Chemical physics and physical chemistry

Dates

Issue 1 (2009)



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