Emiel de Smit et al 2009 J. Phys.: Conf. Ser. 190 012161 doi:10.1088/1742-6596/190/1/012161
Emiel de Smit1, J Fredrik Creemer2, Henny W Zandbergen3, Bert M Weckhuysen1 and Frank M F de Groot1
Show affiliationsIn-situ Scanning X-ray Transmission Microscopy (STXM) allows the measurement of the soft X-ray absorption spectra with 10 to 30 nm spatial resolution under realistic reaction conditions. We show that STXM-XAS in combination with a micromachined nanoreactor can image a catalytic system under relevant reaction conditions, and provide detailed information on the morphology and composition of the catalyst material. The nanometer resolution combined with powerful chemical speciation by XAS and the ability to image materials under realistic conditions opens up new opportunities to study many chemical processes.
82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
82.80.Ej X-ray, Mössbauer, and other gamma-ray spectroscopic analysis methods
Condensed matter: electrical, magnetic and optical
Surfaces, interfaces and thin films
Issue 1 (2009)
Emiel de Smit et al 2009 J. Phys.: Conf. Ser. 190 012161
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