N M Souza-Neto et al 2009 J. Phys.: Conf. Ser. 190 012112 doi:10.1088/1742-6596/190/1/012112
N M Souza-Neto1, A Y Ramos2, H C N Tolentino2 and Y Joly2
Show affiliationsX-ray absorption spectroscopy (XAS) has been used to clarify the thickness-dependent magnetic properties in nanometric CoPt films. We get benefit from the variation of the sampling depth with the grazing angle to investigate the variations of the local order within the film. In order to properly resconstruct the 3D information the experiments were performed either in the in-plane as in the out-of-plane geometries and supported by ab initio calculations. A depth dependence in the chemical order is revealed and the magnetic behavior is interpreted within this framework.
75.70.Ak Magnetic properties of monolayers and thin films
68.55.A- Nucleation and growth
Issue 1 (2009)
N M Souza-Neto et al 2009 J. Phys.: Conf. Ser. 190 012112
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