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Disentangling atomic-layer-specific x-ray absorption spectra by Auger electron diffraction spectroscopy

Fumihiko Matsui1,3, Tomohiro Matsushita2, Yukako Kato1,4, Mie Hashimoto1 and Hiroshi Daimon1

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In order to investigate the electronic and magnetic structures of each atomic layer at subsurface, we have proposed a new method, Auger electron diffraction spectroscopy, which is the combination of x-ray absorption spectroscopy (XAS) and Auger electron diffraction (AED) techniques. We have measured a series of Ni LMM AED patterns of the Ni film grown on Cu(001) surface for various thicknesses. Then we deduced a set of atomic-layer-specific AED patterns in a numerical way. Furthermore, we developed an algorithm to disentangle XANES spectra from different atomic layers using these atomic-layer-specific AED patterns. Surface and subsurface core level shift were determined for each atomic layer.


PACS

78.70.Dm X-ray absorption spectra

75.70.Rf Surface magnetism

75.25.+z Spin arrangements in magnetically ordered materials (including neutron and spin-polarized electron studies, synchrotron-source x-ray scattering, etc.)

73.20.At Surface states, band structure, electron density of states

75.70.Ak Magnetic properties of monolayers and thin films

79.20.Fv Electron impact: Auger emission

Subjects

Condensed matter: electrical, magnetic and optical

Surfaces, interfaces and thin films

Dates

Issue 1 (2009)



  1. Disentangling atomic-layer-specific x-ray absorption spectra by Auger electron diffraction spectroscopy

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