Journal of Physics: Conference Series
Volume 190
Number 1
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K Amemiya et al 2009 J. Phys.: Conf. Ser. 190 012108 doi:10.1088/1742-6596/190/1/012108
Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution
K Amemiya1,2,6, J Miyawaki3, H Abe4, E O Sako1 and M Sakamaki5
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Amemiya K, Kitagawa S, Matsumura D, Yokoyama T and Ohta T 2003 J. Phys.: Condens. Matter 15 S561
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Amemiya K, Matsumura D, Abe H, Kitagawa S, Ohta T and Yokoyama T 2004 Phys. Rev. B 70 195405
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Amemiya K, Sakai E, Matsumura D, Abe H, Ohta T and Yokoyama T 2005 Phys. Rev. B 71 214420
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Amemiya K, Sakai E, Matsumura D, Abe H and Ohta T 2005 Phys. Rev. B 72 201404(R)
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Abe H, Amemiya K, Matsumura D, Kitagawa S, Ohta T, Watanabe H and Yokoyama T 2006 J. Magn. Magn. Mater. 302 86
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Abe H, Amemiya K, Matsumura D, Miyawaki J, Sako E O, Ohtsuki T, Sakai E and Ohta T 2008 Phys. Rev. B 77 054409
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Sakamaki M, Abe H, Sumii R, Amemiya K, Konishi T, Fujikawa T, Baczewski L T, Wawro A, Petroutchik A, Kurant Z and Maziewski A 2009 Acta Phys. Pol. A 115 309
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Abe H, Sakamaki M and Amemiya K submitted to Phys. Rev. B
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Amemiya K, Sako E O, Miyawaki J and Abe H 2007 Japan. J. Appl. Phys. 46 3640
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Miyawaki J, Matsumura D, Abe H, Otsuki T, Sakai E, Amemiya K and Ohta T 2007 AIP Conf. Proc. vol 882 p 505
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Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution
K Amemiya et al 2009 J. Phys.: Conf. Ser. 190 012108
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