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Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution

K Amemiya1,2,6, J Miyawaki3, H Abe4, E O Sako1 and M Sakamaki5

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Recent progresses in the depth-resolved X-ray magnetic circular dichroism (XMCD) and X-ray absorption fine structure (XAFS) techniques are presented. The depth-resolved atomic and magnetic structures of Co films grown on Ru(0001) was investigated by using the depth-resolved XMCD and extended X-ray absorption fine structure EXAFS. The three-dimensional magnetic structure of a micro-patterned Fe/Ni/Cu(100) film was studied by combining the depth-resolved XMCD with the X-ray microbeam. The technique was also applied to Co thin films covered with a relatively thick Mo overlayer, in order to demonstrate the possibility to investigate ex-situ samples with a protection layer.


PACS

78.20.Ls Magnetooptical effects

75.25.+z Spin arrangements in magnetically ordered materials (including neutron and spin-polarized electron studies, synchrotron-source x-ray scattering, etc.)

78.70.Dm X-ray absorption spectra

68.55.A- Nucleation and growth

61.05.cj X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc.

75.70.Ak Magnetic properties of monolayers and thin films

Subjects

Condensed matter: electrical, magnetic and optical

Surfaces, interfaces and thin films

Dates

Issue 1 (2009)



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