F Rodolakis et al 2009 J. Phys.: Conf. Ser. 190 012092 doi:10.1088/1742-6596/190/1/012092
F Rodolakis1,2, P Hansmann3,4, J-P Rueff2,5, A Toschi3, M W Haverkort4, G Sangiovanni3, K Held3, M Sikora6, A Congeduti2, J-P Itié2, F Baudelet2, P Metcalf7 and M Marsi1
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F Rodolakis et al 2009 J. Phys.: Conf. Ser. 190 012092
C I Pakes et al 2003 Nanotechnology 14 157
J Ulanski et al 1990 J. Phys. D: Appl. Phys. 23 75
Yuh-Ying Lin Wang et al 2004 Physiol. Meas. 25 1397
Won Je Lee et al 2006 Physiol. Meas. 27 661
Daniel Torrent and José Sánchez-Dehesa 2008 New J. Phys. 10 063015
C V Raman and K S Krishnan 1925 Proc. Phys. Soc. London 38 350
Didier Sébilleau and Calogero R Natoli 2009 J. Phys.: Conf. Ser. 190 012002
Y Aregbe et al 2004 Metrologia 41 08004
Ralf Seemann et al 2005 J. Phys.: Condens. Matter 17 S267