N Abd el All et al 2009 J. Phys.: Conf. Ser. 190 012066 doi:10.1088/1742-6596/190/1/012066
N Abd el All1, G Dalba1, D Diop2, P Fornasini1, R Grisenti1, F Rocca3, B Thiodjio Sendja2 and M Vaccari4
Show affiliationsCdTe is affected by a low-temperature negative thermal expansion (NTE) of the lattice parameter, whose strength and temperature interval are intermediate between those of the iso-structural crystals Ge and CuCl. EXAFS measurements have been performed on CdTe from 19 to 300 K. The first-shell analysis has led to an accurate evaluation of the bond thermal expansion and of the parallel and perpendicular MSRDs. The values of the relevant parameters measured by EXAFS for CdTe are intermediate between the corresponding values previously found for Ge and CuCl.
65.40.De Thermal expansion; thermomechanical effects
Issue 1 (2009)
N Abd el All et al 2009 J. Phys.: Conf. Ser. 190 012066
Olivier Bernus et al 2002 Phys. Med. Biol. 47 1947
D Hartley et al 1991 J. Phys. A: Math. Gen. 24 5253
M. Dickinson et al 2004 ApJ 600 L99
Hui-Wen Cheng and Yiming Li 2009 Semicond. Sci. Technol. 24 115021
2002 J. Phys.: Condens. Matter 14
W Taweepreda et al 2009 J. Phys.: Conf. Ser. 190 012150
Lei Zhu et al 2009 J. Phys. D: Appl. Phys. 42 225308
J Herrero-Martín et al 2009 J. Phys.: Conf. Ser. 190 012086
Y Rheem et al 2007 J. Phys. D: Appl. Phys. 40 7267