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Valence-selective XAFS spectroscopy using EuLγ4 emission

H Hayashi1, N Kawamura2, M Mizumaki2, T Takabatake3, H Imura4, K Okamoto5 and T Akai4

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EuLγ4 emission spectra show a large chemical shift (~5 eV), depending on the valence state of a compound. The applicability of this emission to valence-selective X-ray absorption fine structure spectroscopy was demonstrated by performing partial fluorescence yield measurements using a 1:1 mixture of EuS and Eu2O3 and using valence-fluctuating compounds, such as Eu3Pd20Ge6 and BaMgAl10O17:Eu.


PACS

78.70.En X-ray emission spectra and fluorescence

78.55.Hx Other solid inorganic materials

78.70.Dm X-ray absorption spectra

71.28.+d Narrow-band systems; intermediate-valence solids

Subjects

Condensed matter: electrical, magnetic and optical

Dates

Issue 1 (2009)



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