Andrea Di Cicco et al 2009 J. Phys.: Conf. Ser. 190 012043 doi:10.1088/1742-6596/190/1/012043
Andrea Di Cicco1,2,3, Giuliana Aquilanti2, Marco Minicucci1, Emiliano Principi1, Nicola Novello2, Andrea Cognigni2 and Luca Olivi2
Show affiliationsThe optical layout of the XAFS beamline at ELETTRA is presented along with its powerful capabilities for collecting XAFS spectra in a wide energy range 2.4 – 27 keV. Recent developments around the ensemble of available instruments made available different collection modes using various sample environments. In particular combined x-ray absorption and diffraction patterns can be collected even at high temperature using a special version of the l'Aquila-Camerino furnace and a MAR image-plate detector. An automated beamline control software allows us to perform successive measurements in different conditions without attending the beamline. Examples of XAFS and diffraction measurements, as well as single-energy temperature scans are presented showing the performances of the beamline for nanocrystalline systems and liquid metals under high temperature conditions.
78.70.Dm X-ray absorption spectra
Soft matter, liquids and polymers
Condensed matter: electrical, magnetic and optical
Issue 1 (2009)
Andrea Di Cicco et al 2009 J. Phys.: Conf. Ser. 190 012043
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