T Uruga et al 2009 J. Phys.: Conf. Ser. 190 012041 doi:10.1088/1742-6596/190/1/012041
T Uruga1, H Tanida, K Kato, Y Furukawa, T Kudo and N Azumi
Show affiliationsBeamline BL01B1 was constructed for conventional XAFS measurements using a bending magnet light source at SPring-8 in 1997 [1]. BL01B1 covers a wide energy range from 3.8 to 113 keV using an adjustable inclined double-crystal monochromator and a double mirror system. Here, we describe a newly developed apparatus and the current status of the BL01B1. A time-efficient QEXAFS method was developed to measure high quality spectra up to high-k regions in the shortest possible time. The method involves sweeping the monochromator continuously at a variable angular speed depending on the k-region using a VME stepping motor controller. During scanning, a pair of crystals of the monochromator rotates without translation motion like a channel-cut crystal. This QEXAFS method was applied to the fluorescence mode using a 19-element Ge detector combined with a digital X-ray processor system. A new conversion electron yield detector having a rotational sample stage was developed for single crystalline samples. Angular oscillations of 4 degrees in the sample rotation stage around the axis normal to the sample surface successfully remove diffraction noise in the XAFS spectra.
78.70.Dm X-ray absorption spectra
07.85.Nc X-ray and gamma-ray spectrometers
41.50.+h X-ray beam source magnets and x-ray optics for control of particle beams
61.05.cj X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc.
41.85.Lc Particle beam focusing and bending magnets, wiggler magnets, and quadrupoles
Accelerators, beams and electromagnetism
Condensed matter: electrical, magnetic and optical
Issue 1 (2009)
T Uruga et al 2009 J. Phys.: Conf. Ser. 190 012041
Jae Young Park et al 2008 Nanotechnology 19 105503
A B Murphy et al 2009 J. Phys. D: Appl. Phys. 42 194006
Daniel Manzano et al 2009 New J. Phys. 11 113018
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Do-Hoon Kwon and Douglas H Werner 2008 New J. Phys. 10 115023
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S B Bubenhofer et al 2009 Nanotechnology 20 485302
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