Evgueni Kleimenov et al 2009 J. Phys.: Conf. Ser. 190 012035 doi:10.1088/1742-6596/190/1/012035
Evgueni Kleimenov1, Anna Bergamaschi1, Jeroen van Bokhoven2, Markus Janousch1, Bernd Schmitt1 and Maarten Nachtegaal1
Show affiliationsA Johann-type X-ray fluorescence spectrometer for XES, RXES/RIXS, HERFD XAS and RXS experiments was designed, constructed and commissioned at the X10DA-SuperXAS beamline of the Swiss Light Source. The spectrometer consists of three key elements: a sample manipulator, an X-ray dispersive element (spherically bent silicon or germanium crystal), and an one-dimensional-array X-ray detector. The detected X-ray fluorescence energy is scanned by changing the angle between the sample, crystal and detector. The energy resolution of the spectrometer ranges from sub-eV to several eV. Thanks to the use of a one-dimensional array detector the spectrometer is easy to align and operate.
07.85.Nc X-ray and gamma-ray spectrometers
78.70.Dm X-ray absorption spectra
78.70.En X-ray emission spectra and fluorescence
07.85.Fv X- and gamma-ray sources, mirrors, gratings, and detectors
Issue 1 (2009)
Evgueni Kleimenov et al 2009 J. Phys.: Conf. Ser. 190 012035
Imed Zine-El-Abidine and Peng Yang 2009 J. Micromech. Microeng. 19 125004
S P Collins et al 2009 J. Phys.: Conf. Ser. 190 012045
Li Guo-Fu et al 2009 Chinese Phys. Lett. 26 114201
P Sharma et al 2009 J. Phys.: Condens. Matter 21 485902
Ali Fathalian and Shahram Nikjo 2009 Phys. Scr. 80 055705
T. Nakano et al 2009 Nucl. Fusion 49 115024
O E Polozhentsev et al 2009 J. Phys.: Conf. Ser. 190 012138
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