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High-resolution hard-X-ray fluorescence spectrometer

Evgueni Kleimenov1, Anna Bergamaschi1, Jeroen van Bokhoven2, Markus Janousch1, Bernd Schmitt1 and Maarten Nachtegaal1

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A Johann-type X-ray fluorescence spectrometer for XES, RXES/RIXS, HERFD XAS and RXS experiments was designed, constructed and commissioned at the X10DA-SuperXAS beamline of the Swiss Light Source. The spectrometer consists of three key elements: a sample manipulator, an X-ray dispersive element (spherically bent silicon or germanium crystal), and an one-dimensional-array X-ray detector. The detected X-ray fluorescence energy is scanned by changing the angle between the sample, crystal and detector. The energy resolution of the spectrometer ranges from sub-eV to several eV. Thanks to the use of a one-dimensional array detector the spectrometer is easy to align and operate.


PACS

07.85.Nc X-ray and gamma-ray spectrometers

78.70.Dm X-ray absorption spectra

78.70.En X-ray emission spectra and fluorescence

07.85.Fv X- and gamma-ray sources, mirrors, gratings, and detectors

Subjects

Condensed matter: electrical, magnetic and optical

Instrumentation and measurement

Dates

Issue 1 (2009)



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