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Variable angle XAFS study of multilayer nanostructure: Determination of selective concentration profile and depth-dependent partial atomic distributions

Yuri Babanov1, Yuri Salamatov1 and Enver Mukhamedzhanov2

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[1]
De Boer D-K-G 1991 Phys Rev B 44 498-511
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[2]
Booth C and Bridge F 2005 Physica Scripta T115 202-204
IOPscience 
[3]
Tikhonov A and Arsenin V 1981 Solution of Ill-Posed Problems (New York:John Willey and Sons, Inc.)

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