Yuri Babanov et al 2009 J. Phys.: Conf. Ser. 190 012030 doi:10.1088/1742-6596/190/1/012030
Variable angle XAFS study of multilayer nanostructure: Determination of selective concentration profile and depth-dependent partial atomic distributions
Yuri Babanov1, Yuri Salamatov1 and Enver Mukhamedzhanov2
Show affiliationsWe propose a new method for studying multilayer structure using angle resolved extended x-ray absorption fine structure (EXAFS) measurements. The linear integral equation describing a connection between the fluorescence intensity for spectrum of element C, the incident beam energy E, the incident angle 
and the concentration profile p(z,C) has been derived. It is a Fredholm integral equation of the first kind, it belongs to the class of ill-posed problems and for solution it needs special methods. We use the regularization method. For determining the depth-dependent partial interatomic distances we use angle resolved EXAFS data. The effectiveness of the method has been tested during numerical simulation on the model crystalline three-layer with BCC structure: Cr/Fe/Cr.
- PACS
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78.70.Dm X-ray absorption spectra
- Subjects
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Condensed matter: electrical, magnetic and optical
- Dates
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Issue 1 (2009)
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Variable angle XAFS study of multilayer nanostructure: Determination of selective concentration profile and depth-dependent partial atomic distributions
Yuri Babanov et al 2009 J. Phys.: Conf. Ser. 190 012030
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