Yung-Jin Hu and Corwin H Booth 2009 J. Phys.: Conf. Ser. 190 012029 doi:10.1088/1742-6596/190/1/012029
Yung-Jin Hu1 and Corwin H Booth2
Show affiliationsThe effect of stochastic noise on Extended X-ray Absorption Fine Structure (EXAFS) data measurement, analysis, and fitting is discussed. Stochastic noise reduces the ability to uniquely fit a calculated model to measured EXAFS data. Such noise can be reduced by common methods that increase the signal-to-noise ratio; however, these methods are not always practical. Therefore, predetermined, quantitative knowledge of the level of acceptable stochastic noise when fitting for a particular model system is essential in maximizing the chances of a successful EXAFS experiment and minimizing wasted beamtime. This paper outlines a method to estimate, through simulation, the acceptable level of stochastic noise in EXAFS spectra that still allows a successful test of a proposed model compound.
78.70.Dm X-ray absorption spectra
61.05.cj X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc.
Issue 1 (2009)
Yung-Jin Hu and Corwin H Booth 2009 J. Phys.: Conf. Ser. 190 012029
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