B E O'Rourke et al 2009 J. Phys.: Conf. Ser. 163 012103 doi:10.1088/1742-6596/163/1/012103
B E O'Rourke1,2, S Geyer1,3, A Silze4, A Solokov1, G Vorobjev1, D F A Winters1,5, O Kester1 and Th Stóhlker1,5
Show affiliationsThis contribution describes the current set-up and future plans for a small permanent magnet electron beam ion trap (EBIT) which has been installed at GSI. The EBIT is planned to serve as an off-line test ion source for experiments on the HITRAP project and also as a test-bed for instrumentation under development for the SPARC collaboration which is part of the new FAIR facility to be built at GSI. In order to increase the range of highly charged ion species which are produced by the source a charge breeding program has been initiated in which singly charged ions are externally injected into the EBIT with high efficiency. We describe recent results from the initial conditioning of the EBIT along with preliminary results of charge breeding tests.
29.25.Lg Ion sources: polarized
Accelerators, beams and electromagnetism
Instrumentation and measurement
Issue 1 (2009)
B E O'Rourke et al 2009 J. Phys.: Conf. Ser. 163 012103
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