V Delaubert et al 2002 J. Opt. A: Pure Appl. Opt. 4 393 doi:10.1088/1464-4258/4/4/305
V Delaubert, D A Shaddock, P K Lam, B C Buchler, H-A Bachor and D E McClelland
Show affiliationsWe propose optical techniques for the generation of a TEM00 Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer. The produced phase-flipped mode is the ideal light mode for optical measurements requiring high precision in one spatial dimension. Two examples of such applications are discussed.
42.55.Rz Doped-insulator lasers and other solid state lasers
42.60.Jf Beam characteristics: profile, intensity, and power; spatial pattern formation
42.60.Lh Efficiency, stability, gain, and other operational parameters
06.30.Bp Spatial dimensions (e.g., position, lengths, volume, angles, and displacements)
Issue 4 (July 2002)
Received 9 August 2001, in final form 15 March 2002
Published 23 May 2002
V Delaubert et al 2002 J. Opt. A: Pure Appl. Opt. 4 393
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