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Interaction of highly charged clusters with surface

E S Parilis

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The purpose of this paper is to draw attention to phenomena occurring on solid surfaces under impact of new kinds of projectiles—slow, very large and highly charged clusters produced in modern electrospray ionization sources.

It is known that slow highly charged atomic ions, for instance Xe+44, approaching a non-metal surface cause sputtering, erosion and create craters and blisters via the mechanism of Coulomb explosion following a cascade Auger neutralization, emitting vast amounts of secondary electrons.

The same mechanism should create analogous nano-features on a non-metal surface under impacts of clusters containing up to 108–109 molecules with a mass of up to 109–1010 amu and a diameter as large as 103 nm, their charge reaching several 103 e, albeit the charge-to-mass ratio would not exceed 10−7–10−6 e amu−1. When accelerated using a voltage of up to 104 V, the clusters can acquire a kinetic energy of 104 keV, but a very slow velocity, less than 5×104 cm s−1, which corresponds to about 10−2 eV atom−1, well below the threshold of kinetic electron emission. The conditions are favorable for Auger neutralization-induced potential electron emission.

The estimates, inevitably approximate in the absence of any experimental data, predict that the diameter of the craters could be around 10 nm, the number of sputtered atoms could be as large as 105 atoms per cluster and the yield of ejected electrons could reach up to several thousand electrons per cluster. These numbers show that both experimental studies of the phenomena and a search for their possible applications are worth performing.


PACS

79.20.Rf Atomic, molecular, and ion beam impact and interactions with surfaces

79.20.Fv Electron impact: Auger emission

68.49.-h Surface characterization by particle-surface scattering

79.20.Hx Electron impact: secondary emission

68.49.Sf Ion scattering from surfaces (charge transfer, sputtering, SIMS)

Subjects

Condensed matter: electrical, magnetic and optical

Surfaces, interfaces and thin films

Dates

Issue 5 (November 2009)

Received 17 November 2008, accepted for publication 14 July 2009

Published 5 October 2009



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