X-ray absorption fine-structure determination of interfacial polarization in SrTiO3 thin films grown on Si(001)

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Published under licence by IOP Publishing Ltd
, , Citation J C Woicik et al 2005 Phys. Scr. 2005 620 DOI 10.1238/Physica.Topical.115a00620

1402-4896/2005/T115/620

Abstract

Polarization-dependent x-ray absorption fine structure together with x-ray diffraction have been used to study the local structure in SrTiO3 thin films grown on Si(001). Our data indicate that an interfacial polarization of the SrTiO3 layer by the Si substrate results in a tetragonal distortion of the SrTiO3 unit cell.

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10.1238/Physica.Topical.115a00620