J C Woicik et al 2005 Phys. Scr. 2005 620 doi:10.1238/Physica.Topical.115a00620
J C Woicik1, F S Aguirre-Tostada2, A Herrera-Gomez2, R Droopad3, Z Yu3, D Schlom4, E Karapetrova5, P Zschack5 and P Pianetta6
Show affiliationsPolarization-dependent x-ray absorption fine structure together with x-ray diffraction have been used to study the local structure in SrTiO3 thin films grown on Si(001). Our data indicate that an interfacial polarization of the SrTiO3 layer by the Si substrate results in a tetragonal distortion of the SrTiO3 unit cell.
68.55.A- Nucleation and growth
77.84.Dy Niobates, titanates, tantalates, PZT ceramics, etc.
61.05.cj X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc.
Issue T115 (2005)
Received 26 June 2003, accepted for publication 8 December 2003
J C Woicik et al 2005 Phys. Scr. 2005 620
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