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Symmetry breaking in few layer graphene films

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Published 31 October 2007 • Published under licence by IOP Publishing Ltd
, , Focus on Advances in Surface and Interface Science Citation Aaron Bostwick et al 2007 New J. Phys. 9 385 DOI 10.1088/1367-2630/9/10/385

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Author affiliations

1 Advanced Light Source, E O Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA

2 Department of Molecular Physics, Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 14195 Berlin, Germany

3 Department of Physics, Montana State University, P O Box 173840, Bozeman, MT 59717-3840, USA

4 Institut für Physik der Kondensierten Materie, Lehrstuhl für Technische Physik, Universität Erlangen-Nürnberg, Erwin-Rommel-Straße 1,D-91058 Erlangen, Germany

5 Author to whom any correspondence should be addressed.

Dates

  1. Received 22 May 2007
  2. Published

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1367-2630/9/10/385

Abstract

Recently, it was demonstrated that the quasiparticle dynamics, the layer-dependent charge and potential, and the c-axis screening coefficient could be extracted from measurements of the spectral function of few layer graphene films grown epitaxially on SiC using angle-resolved photoemission spectroscopy (ARPES). In this paper we review these findings, and present detailed methodology for extracting such parameters from ARPES. We also present detailed arguments against the possibility of an energy gap at the Dirac crossing ED.

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10.1088/1367-2630/9/10/385