New J. Phys. 2 (2000) 27
PII: S1367-2630(00)14535-5
Field polarization and polarization charge distributions in plasmon resonant nanoparticles
J P Kottmann1, O J F Martin1, David R Smith2 and Sheldon Schultz2
1 Electromagnetic Fields
and Microwave Electronics Laboratory,
2 Department of Physics, University of
California, San Diego,
E-mail: kottmann@ifh.ee.ethz.ch and
martin@ifh.ee.ethz.ch
Swiss Federal Institute of Technology, ETH-Zentrum, 8092 Zurich,
Switzerland
9500 Gilman Drive, La Jolla, CA 92093-0319, USA
New Journal of Physics 2 (2000)
27.1-27.9
Received 7 June 2000; online 3 November 2000
| Abstract. We study the plasmon resonances for small two-dimensional silver particles (nanowires) with elliptical or triangular shapes in the 20 nm size range. While the elliptical particle has only two resonances, a well known fact, we demonstrate that the triangular particle displays a much more complex behaviour with several resonances over a broad wavelength range. Using animations of the field amplitude and field polarization, we investigate the properties of these different resonances. The field distribution associated with each plasmon resonance can be related to the polarization charges on the surface of the particles. Implications for the design of plasmon resonant structures with specific properties, for example, for nano-optics or surface enhanced Raman scattering are discussed. |
For metals like silver and gold, the plasma frequency
of the
electron gas lies in the optical range. This renders very strong the
interaction of these metals with light and leads to a highly dispersive
dielectric function at optical frequencies [1,2]. In
particular, the real part of the permittivity
changes
sign when the illumination frequency
passes close to
. For particles smaller than the
skin depth, this microscopic interaction can
result in a resonance of the entire particle, known as a plasmon resonance or
a surface mode of the particle [1,3].
The boundary conditions imposed by Maxwell's equations on the surface
of the particle determine whether such a resonance can build up.
Therefore, the shape- and the frequency-dependent permittivity of
the particle command the spectrum of resonances that can be excited in
the particle. For example, it is well known that a spherical
nanoparticle has its single resonance frequency when
,whereas a cylindrical particle
is resonant when
[1].
Contrary to these simple shapes with a single resonance, scatterers with a more complex boundary can have several resonances. The simplest case is that of an ellipse, where two different modes can be excited [1]. For more complex geometries this problem cannot be solved analytically and one must resort to numerical methods. The resonances of cubic particles, for example, have been investigated in the electrostatic limit by Fuchs [4], while Jensen et al studied truncated tetrahedra in the 100 nm range [5].
We recently developed a new computational technique for the study of the resonances of structures with an arbitrary shape [6]. In [7], we investigated, from a phenomenological point of view, the plasmon resonances of non-regular silver particles in the 10-100 nm range and discussed their dependency on the particle shape and size as well as on the direction of illumination.
In the present publication, we shall concentrate on two exemplary particle shapes, a regular one (ellipse) and a non-regular one (triangle), and investigate the phenomena that give rise to the much more complex resonance spectrum for the latter particle type. For this purpose, after determining the resonance spectra from scattering cross sections (SCSs) for these two classes of particles, we will present movies with the temporal evolution of the field distribution and the polarization charge distributions associated with each resonance.
We investigate two-dimensional (2D) silver scatterers, i.e. particles with a translation symmetry along the third (not shown) space dimension (nanowires). The particles are illuminated using a plane wave propagating in the plane of the figure with the electric field also in the plane of the figure (so-called transverse electric wave).
We choose particles in the 20 nm size range, leading to narrow and well separated resonances (larger particles have much broader resonances [7]). Moreover, this size range is of particular interest because it is associated with the strongest local field enhancements [8], and structures of that scale can now be fabricated in a controlled manner [9]-[12].
For our numerical simulations we use a recently developed technique for the solution of the volume integral equation [6]
![]() |
(1) |
that gives the total electric field
E(r) scattered by a system
with permittivity
embedded in an infinite
homogeneous background
when it is illuminated with
an
incident field E0. For a detailed derivation
of (1), see
[13] where expressions for the Green
tensor
GB associated with 2D and 3D backgrounds are
given.
To accurately accommodate the very strong field variations that occur
in plasmon resonant particles we use finite elements to approximate
the electric field
E(r), as well as a new
regularization
scheme to handle the singularity of the Green tensor when
. The scatterer is discretized using a few thousand
triangular elements.
We refer the reader to [6], where this numerical
technique is described in detail and its accuracy assessed.
For the frequency-dependent permittivity
of the silver scatterers,
we use the experimental data of Johnson and Christy [14].
Let us note that particles down to 2 nm can be well modelled
using a local dielectric function [15]. However,
this dielectric function might differ
from its bulk value and depend on the particle geometry since the
mean free path of the electrons decreases due to scattering at the
surface. It turns out that for silver particles only the
imaginary part of
is affected
[15]-[17] and, for the particle
dimensions in the present study, the bulk permittivity remains a
good approximation.
To ease comparison we use the same colour scale throughout the paper for the
maps of the electrical field amplitude. Since we observe very important
variations in the scattered field from one case to another, we take a
logarithmic colour scale to highlight the details of each field distribution.
The amplitude of the incident field is always one. In the
movies, each arrow
that represents the orientation of the electric field is normalized to the
local field amplitude. This allows one to visualize the orientation of the
electric field despite the strong variation of its amplitude. For the
polarization charge distribution we use a colour representation that
emphasizes the charge motion during one period, and this is different for
each
figure.
We first consider a 20 nm
nm
elliptical particle, illuminated along the (11) direction. We recover
the well known result that such an ellipse has two resonances, as
illustrated in figure 1, where the SCS is
given
as a function of the wavelength [1]. We also give in
this figure the SCSs for illumination directions parallel to either of
the ellipse axes. In such a case the two resonances are decoupled: the
resonance at
nm being related to the electric
field parallel to the minor axis and that at
nm
to the electric field parallel to the major axis (figure 1).
| Figure 1.
SCS for an ellipse (overall size 20 nm |
In figure 2 we show the field distribution for
three different
wavelengths. The illumination direction is the (11) direction (i.e. the
incident electric field is polarized in the (
1) direction). The
movies
linked to figure 2 illustrate the
variation of the field
polarization over one period, each arrow indicating the instantaneous
direction and the relative magnitude of the electric field.
| Figure 2.
Electrical field amplitude distribution for a
20 nm |
When out of resonance, at
nm where the real part of
the
permittivity of silver
is still positive, the
scattered field remains parallel to the illumination field
(figure 2(a)). A small amplitude field
enhancement, in the order of
twice the illumination amplitude, is observed in the regions where the
electric field is normal to the particle interface. This effect can be
related
to the continuity of the displacement field [18]. On the other
hand, no enhancement appears where the electric field is parallel to the
interface since the boundary conditions now require this field to be
continuous (figure 2(a)).
For the resonance at
nm we observe that the field
amplitude is
enhanced homogeneously by a factor of about 10 inside the particle
(figure 2(b)). Furthermore, the electric
field inside the particle is
parallel to the minor axis, although the incident field is polarized in the
(
1) direction. This can be easily understood.
As seen in
figure 1, the (01) electric field
component is in resonance, and its
influence on the near-field overweights that of the `non-resonant' (10)
component (figure 2(b)). For the other
resonance, at
nm, we have the converse effect: the
(10) component is resonant
and the electric field becomes parallel to the major axis
(figure 2(c)). The field amplitude
enhancement at the vicinity of the
particle reaches now about 15.
Note, also, that there is a phase shift of approximately
at the
main
resonance between the incident field and the scattered field near the
particle
(figure 2(c)). This phenomenon is well
known from classical
mechanics, where such a phase shift is observed when the driving frequency
and
the eigenfrequency of the system are close.
In figure 3 we show the polarization charge
distribution, which is
simply given by the divergence of the electric field [19]. (The
numerical evaluation of this divergence is quite sensitive to the
discretization used, which explains the roughness observed in some of the
polarization charge images.) When out of resonance the particle is polarized
parallel to the incident (
1) electric field and oscillates
in
phase (figure 3(a)). For the resonance at
nm, the
positive and negative charge distribution is nearly symmetrical with respect
to the major axis, again indicating the dominating role played by this
resonance (figure 3(b)). As expected,
this is conversely the case for
the resonance at
nm (figure 3(c)).
| Figure 3.
Polarization charge distribution for a
20 nm |
The SCS for a 10 nm base, 20 nm perpendicular right-angled triangle, illuminated along the (11) direction is reproduced in figure 4. Dealing with sharp corners introduces additional numerical difficulties since the field becomes singular at short distances from an infinitely sharp and perfectly conducting corner [20]. However, the sharpness of a real particle is limited by the surface and boundary energies. We therefore rounded off each corner by 0.25 nm, thereby providing a more realistic model and removing numerical instabilities. The results reported in figure 4 were obtained with 3000 triangular discretization elements. We verified that 2000 or 4000 discretization elements produced exactly the same numerical results.
| Figure 4. SCS for a 10 nm base, 20 nm perpendicular right-angled triangle, as a function of the illumination wavelength. |
We now observe a much more complex structure with several resonances covering a broad wavelength range, from 329 nm to 458 nm. The response of the particle varies extremely rapidly and, for example, a 40 nm variation in the illumination wavelength (from 418 nm to 458 nm) leads to a change of more than two orders of magnitude in the SCS (figure 4).
It is difficult from the data in figures 1 and 4 to
draw
conclusions on the influence of the particle shape on the linewidth of the
plasmon resonances. For example, the full-width at half-maximum (FWHM) of the
main resonance in figure 4 (
nm,
nm) is
close to the value obtained for the ellipse (
nm,
nm, figure 1). However, it is important to note that
both particles do not have exactly the same area, a parameter that strongly
influences the resonance linewidth (for a constant shape, the plasmon
resonances broaden when the particle size increases [7]).
The field distribution corresponding to the four resonances labelled in
figure 4 is reported in figure 5, together with the field
distribution out of resonance (
nm, figure 5(a)). In
this last case, the field distribution inside the particle is homogeneous, as
for the ellipse. This is not the case at the main resonance, where we observe
a 400-fold amplitude enhancement at the sharp corner, while the field
vanishes
along the triangle's base. Although the field is strongly localized at a
vicinity close to particle, its amplitude remains 10 times that of the
incident field at a 10 nm distance from the sharp corner
(figure 5(b)). In the corresponding
movie, we observe that the phase
shift between the incident field and the scattered near field is nearly
.
| Figure 5.
Electrical field distribution for a 10 nm
base,
20 nm perpendicular right-angled triangle: (a) |
The resonance at
nm is also associated with a
large enhancement near the sharp corner. The field distribution,
however, is completely different and the field amplitude decreases
much faster outside the particle (figure 5(c)). The third resonance,
nm, is associated with a moderate
enhancement
(in the order of 60) at the lower right-hand corner (figure 5(d)).
Perhaps, the most surprising resonance is that obtained for
nm
(figure 5(e)). Although the corresponding
near-field enhancement is
comparatively modest (about 10), the field maximum is obtained at the corner
longitudinal to the incidence (remark that for the previously
discussed resonances, the maximum enhancement was obtained at a corner
located
transversely to the propagation direction of the incident field, see
figures 5(b)-(d)). As discussed in [7], this
resonance has other surprising properties: in a triangular particle it exists
for every direction of incidence and has its field maximum always in the
corner longitudinal to the incidence. Moreover, in contrast to the other
resonances, this mode is not red shifted when the particle size increases.
These properties, plus the fact that the (negative) particle permittivity is
close to zero at this wavelength, indicate that this resonance is related to
the bulk mode [21].
To better understand the intrinsic properties of the different resonances
illustrated in figure 5, we report in
figure 6 the
corresponding polarization charge distributions. We also give the charge
distribution out of resonance, at
nm (figure 6(a)). In
this case we observe that the charges just oscillate, parallel to the
direction of the incident field, between the two opposite
corners.
| Figure 6.
Polarization charge distribution for a 10 nm
base,
20 nm perpendicular right-angled triangle:
(a) out of resonance, |
For the three plasmon resonances, figure 6(b)-(e), we notice that
each resonance is associated with a different charge distribution. In the
main
resonance,
nm, we observe that charges of a
given sign build up
at the sharp corner, while opposite charges are distributed on the entire
circumference of the particle (figure 6(b)). This distribution
oscillates over time, the sign of the accumulated charges on the sharp corner
changing every half-period.
For the next resonance,
nm, both charge species accumulate
simultaneously at the sharp corner: one species accumulates at the very tip,
while the species of opposite sign is distributed along the adjacent sides
(figure 6(c)). This dipolar-like
charge distribution
determines the field at the sharp corner. As mentioned previously, at this
wavelength the field intensity in the vicinity of the corner decreases much
faster than in the main resonance, which is associated with a
point-like charge distribution (compare with figure 6(b)). This
difference of distance dependence as a function of excited resonance, i.e. as
a function of illumination wavelength, could be evidenced by the approach
curves in scanning near-field optical microscopy experiments [22].
For the third resonance,
nm, a similar behaviour
is observed,
with both positive and negative charges accumulating simultaneously at the
sharp
corner and also now at the lower right-hand side corner (figure 6(d)).
Finally, for the bulk mode, at
nm,
we obtain a rather complex charge distribution (figure 6(e)):
little charge now accumulates at both sharp corners, whereas a fair amount
of charges is located near the lower left-hand side corner.
Note, also, that in contrast to the previously discussed resonances, opposite
charges accumulate on each side adjacent to this corner.
Let us finally mention that, since the spectrum of resonances
is fairly dense and the resonances have a given width, each charge
distribution in figure 6 does not
correspond to a
single isolated resonance, but can be influenced by neighbouring
resonances (except maybe for the main resonance at
nm).
We have studied the plasmon resonances associated with regularly shaped (elliptical) and non-regularly shaped (triangular) particles and have shown that the latter have a much more complex spectrum, with more resonances and which also covers a broader wavelength range.
The strong fields associated with these resonances can be related to the polarization charges accumulating on the particle surface. These charges determine the strength and polarization of the field distribution inside the particle and at its vicinity. This field distribution strongly depends on the resonance excited in the particle, i.e. on the illumination wavelength.
The calculations presented here, together with on-going work, should provide some insight into the plasmon resonances of metallic nanoparticles with non-regular shapes. They should help in the design and engineering of nanostructures with particular properties, which are used to generate strongly confined electromagnetic fields. Such fields play, for instance, a key role in surface enhanced Raman scattering, where the Raman signal of molecules located on plasmon resonant metal particles is enhanced by several order of magnitudes [23]-[26]. Furthermore, the study of metallic nanowires sustaining plasmon resonances is also becoming a very active research field, with exciting applications in nano-optics [27]-[29].
We are most grateful to J Favre from the Swiss Center of Scientific Computing for his precious help with data visualization. This work was supported by the Swiss National Science Foundation and by the US NSF (NSF-DMR-96-23949 and NSF-DMR-97-24535).
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