R Claessen et al 2009 New J. Phys. 11 125007 doi:10.1088/1367-2630/11/12/125007
Hard x-ray photoelectron spectroscopy of oxide hybrid and heterostructures: a new method for the study of buried interfaces
Focus on Advances in Surface and Interface Science 2009R Claessen1,3, M Sing1, M Paul1, G Berner1, A Wetscherek1, A Müller1 and W Drube2
Show affiliationsPart of Focus on Advances in Surface and Interface Science 2009
Hard x-ray photoelectron spectroscopy (HAXPES) is a new variant of the well-established photoemission technique, which extends its range to much higher photoelectron energies up to 10 keV and thus to enhanced probing depths of the order of 10 nm and beyond. This not only facilitates direct access to the intrinsic bulk electronic structure of solids, but also allows extended depth profiling and the study of buried interfaces not possible by conventional photoemission. Here, we present two HAXPES case studies on transition metal hybrid and heterostructures demonstrating the potential of the method. We also discuss a new HAXPES setup at the high-brilliance hard x-ray synchrotron radiation source PETRA III at DESY (Hamburg) currently under construction.
- PACS
- Subjects
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Condensed matter: electrical, magnetic and optical
- Dates
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Issue 12 (December 2009)
Received 15 June 2009
Published 11 December 2009
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Hard x-ray photoelectron spectroscopy of oxide hybrid and heterostructures: a new method for the study of buried interfaces
R Claessen et al 2009 New J. Phys. 11 125007
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