Theophilos Maltezopoulos et al 2008 New J. Phys. 10 033026 doi:10.1088/1367-2630/10/3/033026
Single-shot timing measurement of extreme-ultraviolet free-electron laser pulses
Theophilos Maltezopoulos1,4, Stefan Cunovic2, Marek Wieland3, Martin Beye3, Armin Azima1, Harald Redlin1, Maria Krikunova3, Roland Kalms3, Ulrike Frühling1, Filip Budzyn3, Wilfried Wurth3, Alexander Föhlisch3 and Markus Drescher3
Show affiliationsArrival time fluctuations of extreme-ultraviolet (EUV) pulses from the free-electron laser in Hamburg (FLASH) are measured single-pulse resolved at the experimental end-station. To this end, they are non-collinearly superimposed in space and time with visible femtosecond laser pulses on a GaAs substrate. The EUV irradiation induces changes of the reflectivity for the visible pulse. The temporal delay between the two light pulses is directly encoded in the spatial position of the reflectivity change which is captured with a CCD camera. For each single shot, the relative EUV/visible arrival-time can be measured with about 40 fs rms accuracy. The method constitutes a novel route for an improvement of future pump–probe experiments at short-wavelength free-electron lasers (FELs) by a pulse-wise correction with simultaneously measured arrival times of individual EUV pulses.
- PACS
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61.80.Ba Ultraviolet, visible, and infrared radiation effects (including laser radiation)
- Subjects
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Accelerators, beams and electromagnetism
Surfaces, interfaces and thin films
- Dates
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Issue 3 (March 2008)
Received 21 September 2007
Published 17 March 2008
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Single-shot timing measurement of extreme-ultraviolet free-electron laser pulses
Theophilos Maltezopoulos et al 2008 New J. Phys. 10 033026
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