M F Kling et al 2008 New J. Phys. 10 025024 doi:10.1088/1367-2630/10/2/025024
Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields
Focus on Attosecond PhysicsM F Kling1,2,6, J Rauschenberger2,3, A J Verhoef2, E Hasović4, T Uphues2, D B Milošević4,5, H G Muller1 and M J J Vrakking1,6
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Sub-femtosecond control of the electron emission in above-threshold ionization of the rare gases Ar, Xe and Kr in intense few-cycle laser fields is reported with full angular resolution. Experimental data that were obtained with the velocity-map imaging technique are compared to simulations using the strong-field approximation (SFA) and full time-dependent Schrödinger equation (TDSE) calculations. We find a pronounced asymmetry in both the energy and angular distributions of the electron emission that critically depends on the carrier-envelope phase (CEP) of the laser field. The potential use of imaging techniques as a tool for single-shot detection of the CEP is discussed.
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Issue 2 (February 2008)
Received 2 October 2007
Published 29 February 2008
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Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields
M F Kling et al 2008 New J. Phys. 10 025024
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