The following article is Open access

Solution–TiO2 Interface Probed by Frequency-Modulation Atomic Force Microscopy

, , , , , , , and

Published 20 August 2009 • Copyright (c) 2009 The Japan Society of Applied Physics
, , Citation Takumi Hiasa et al 2009 Jpn. J. Appl. Phys. 48 08JB19 DOI 10.1143/JJAP.48.08JB19

Download Article PDF

Article metrics

374 Total downloads

Share this article

Author affiliations

1 Department of Chemistry, Kobe University, Kobe 657-8501, Japan

2 Shimadzu Corporation, Kyoto 604-8511, Japan

3 Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan

4 Innovative Collaboration Center, Kyoto University, Kyoto 606-8501, Japan

5 Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8530, Japan

Dates

  1. Received 21 January 2009
  2. Accepted 26 March 2009
  3. Published

Buy this article in print

Journal RSS
Sign up for new issue notifications
1347-4065/48/8S2/08JB19

Abstract

The topography and solvation structure of a solution–TiO2 interface were observed in the dark using highly sensitive, frequency-modulated atomic force microscopy (FM-AFM). The nucleation and growth of an ionic solute, KCl, in this study, were observed in constant frequency-shift topography. The force applied to the tip was determined as a function of tip–surface distance. Modulations were identified on some force curves and were found to be related to the site-specific density of water molecules.

Export citation and abstract BibTeX RIS

Previous article in issue
Next article in issue

Content from this work may be used under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.

Please wait… references are loading.
10.1143/JJAP.48.08JB19