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An investigation of thin PVDF films as fluctuating-strain-measuring and damage-monitoring devices

H Zhang, S C Galea, W K Chiu and Y C Lam

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A study of piezoelectric films as sensors for detecting fluctuating area-averaged strain has been conducted. Both theoretical and experimental results on the characterization of piezoelectricity are presented for KYNAR Piezo Films. The theoretical formula relating the in-plane area-averaged strain to the electric output of a piezo film through a charge amplifier was derived, and the relevant constants were determined experimentally. The present results show that if the films are prepared and adhered properly, they can be used satisfactorily for fluctuating strain measurement. The present work has also investigated the possibility of using PVDF films as sensors for monitoring crack growth on a metallic specimen.


PACS

81.40.Np Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure

77.55.+f Dielectric thin films

62.20.M- Structural failure of materials

07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

46.80.+j Measurement methods and techniques in continuum mechanics of solids

85.50.-n Dielectric, ferroelectric, and piezoelectric devices

Subjects

Electronics and devices

Instrumentation and measurement

Surfaces, interfaces and thin films

Condensed matter: structural, mechanical & thermal

Dates

Issue 4 (December 1993)



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