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Effect of different elementary processes on the breakdown in low-pressure helium gas

P Hartmann, Z Donkó, G Bánó, L Szalai and K Rózsa

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We investigated the breakdown in low-pressure helium gas both experimentally and by computer simulations. At low breakdown voltages (VBR le 1000 V) the experimental and simulation results show a good agreement (differences are within 20%), while at higher voltages the simulations and experiments agree qualitatively. Our simulations indicate that several processes contribute to the particular shape of the Paschen curve in helium at low pressures. These processes are: (1) the dependence of the (ion-induced) secondary electron emission yield on the ion energy, (2) the appearance of ion impact ionization of the gas at high electric fields and (3) the secondary electron emission from the cathode due to fast neutral atoms.


PACS

52.20.-j Elementary processes in plasmas

52.65.-y Plasma simulation

51.50.+v Electrical properties (ionization, breakdown, electron and ion mobility, etc.)

52.25.Jm Ionization of plasmas

52.80.Tn Other gas discharges

Subjects

Plasma physics

Dates

Issue 2 (May 2000)

Received 11 August 1999, in final form 26 January 2000



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