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Effect of insulator sleeve length on soft x-ray emission from a neon-filled plasma focus device

R S Rawat1, T Zhang, C B L Phua, J X Y Then, K A Chandra, X Lin, A Patran and P Lee

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Insulator sleeves of different lengths were used at the closed end of the coaxial electrode assembly of the 3.3 kJ United Nation University-International Centre for Theoretical Physics (UNU-ICTP) plasma focus device to investigate soft x-ray (SXR) (900–1550 eV) yield for different filling gas pressures of neon. The time and space resolved SXR emission characteristics were investigated using a multi-channel diode x-ray spectrometer and a CCD based pinhole imaging camera. At pressures below 6 mbar, the average SXR yield was also found to increase with increasing sleeve length from 19 to 22 mm. A further increase in insulator sleeve length to 25 mm, however, decreased the SXR yield. At pressures above 6 mbar, the SXR yields were almost the same for insulator sleeves of different lengths. The UNU-ICTP plasma focus device is found to be best optimized for neon SXR production with a 22 mm insulator sleeve at 4 mbar filling gas pressure, with the highest average yield of 8.2 J per shot, for which the conversion efficiency is about 0.25%. For this sleeve length, even the average yield at 2 or 6 mbar pressure was comparable with the maximum yield of a 25 mm sleeve.


PACS

52.25.Os Emission, absorption, and scattering of electromagnetic radiation

52.58.Lq Z-pinches, plasma focus and other pinch devices

52.70.-m Plasma diagnostic techniques and instrumentation

Subjects

Instrumentation and measurement

Plasma physics

Dates

Issue 4 (November 2004)

Received 16 March 2004

Published 20 August 2004



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