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Study of the electrical contact resistance of multi-contact MEMS relays fabricated using the MetalMUMPs process

L Almeida1, R Ramadoss1, R Jackson2, K Ishikawa3 and Q Yu3

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The reliability of electrostatically actuated ohmic contact type MEMS relays has been investigated. Multi-contact MEMS relays laterally actuated using electrostatic comb-drive actuators were used in this study. The MEMS relays were fabricated using the MetalMUMPs process, which uses a 20 µm thick electroplated nickel as the structural layer. A 3 µm thick gold layer was electroplated on the electrical contact surfaces. An example MEMS relay with planar contacts of area 80 µm × 20 µm and spacing of 10 µm between the movable and fixed contacting surfaces is discussed. The overall size of the relay is approximately 3 mm × 3 mm. 'Resistance versus applied voltage' characteristics have been studied. At an applied dc bias voltage of 120 V, the movable fingers make initial contact with the fixed fingers. The 'resistance versus applied voltage' characteristics have been measured for an applied bias voltage in the range of 172–220 V. Reliability testing of the MEMS relay up to one million actuations has been carried out and the resistance degradation with actuation cycles is discussed.


PACS

85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices

07.07.Tw Servo and control equipment; robots

84.32.Dd Connectors, relays, and switches

Subjects

Electronics and devices

Instrumentation and measurement

Nanoscale science and low-D systems

Dates

Issue 7 (July 2006)

Received 13 December 2005, in final form 14 December 2005

Published 3 May 2006



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