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Novel exposure methods based on reflection and refraction effects in the field of SU-8 lithography

Won-Jong Kang, Erik Rabe, Stefan Kopetz and Andreas Neyer

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Thick-film photolithography based on SU-8 has gained great interest in the field of microreplication technologies. For replication applications the SU-8 structures themselves or electroplated copies of the resist structures are used as casting or embossing tools. In this paper, a simple estimation model is proposed to predict the sidewall profiles of SU-8. This model is based on the effects of Fresnel diffraction and absorption resulting in useful approximations for the pattern profile of SU-8. Its usefulness is successfully verified by experimental results; the estimated and experimental results show similar trends. In addition, by utilizing this model two exposure methods based on reflection and refraction could be developed which avoid negatively sloped sidewall profiles of SU-8. Using these exposure methods, SU-8 preforms without undercut for the replication of optical waveguides have been achieved.


PACS

42.82.Cr Fabrication techniques; lithography, pattern transfer

42.25.Fx Diffraction and scattering

42.82.Ds Interconnects, including holographic interconnects

42.25.Gy Edge and boundary effects; reflection and refraction

42.82.Et Waveguides, couplers, and arrays

Subjects

Optics, quantum optics and lasers

Dates

Issue 4 (April 2006)

Received 7 November 2005, in final form 21 February 2006

Published 20 March 2006



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