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Fabrication of thick silicon dioxide sacrificial and isolation blocks in a silicon substrate

Hongrui Jiang1,5, Kyutae Yoo1, Jer-Liang Andrew Yeh2,6, Zhihong Li1,4,7 and Norman C Tien3

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A silicon micromachining method that is able to create deep silicon dioxide blocks at selected locations in a silicon substrate is presented. The process combines deep-reactive-ion etching (DRIE), thermal oxidation, deposition of silicon dioxide and optional planarization. Design issues and parameters for the creation of such blocks are discussed. The selectively defined silicon dioxide blocks allow the integration of silicon surface and bulk micromachining and thick large-area isolation regions for integrated circuits. The performance enhancement that this approach enables is exemplified in the fabrication of an on-chip tunable capacitor and a monolithic transformer on 20-μm-deep silicon dioxide blocks.


PACS

85.40.-e Microelectronics: LSI, VLSI, ULSI; integrated circuit fabrication technology

84.30.-r Electronic circuits

81.20.Wk Machining, milling

84.32.Tt Capacitors

85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices

Subjects

Electronics and devices

Nanoscale science and low-D systems

Condensed matter: structural, mechanical & thermal

Dates

Issue 1 (January 2002)

Received 22 August 2001, in final form 24 October 2001

Published 11 December 2001



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