S Fremy et al 2012 Nanotechnology 23 055401 doi:10.1088/0957-4484/23/5/055401
S Fremy, S Kawai, R Pawlak, T Glatzel, A Baratoff and E Meyer
Show affiliationsThree-dimensional dynamic force spectroscopy measurements were carried out above KBr(001) at low temperature in order to investigate the distance dependence of the tip–sample interactions. In particular, the recorded 3D frequency shift data as well as the extracted interaction force and potential energy fields were analysed with respect to influences of tip and/or sample deformations. We found that a postprocessing correction of the observed deformations significantly modifies the magnitude of the extracted interaction forces and also the image contrast.
68.37.Ps Atomic force microscopy (AFM)
81.40.Lm Deformation, plasticity, and creep
62.20.F- Deformation and plasticity
68.35.B- Structure of clean surfaces (and surface reconstruction)
Issue 5 (10 February 2012)
Received 20 August 2011, in final form 7 November 2011
Published 11 January 2012
S Fremy et al 2012 Nanotechnology 23 055401
Byeonghee Lee et al 2012 Nanotechnology 23 055709
A Espinosa et al 2012 Meas. Sci. Technol. 23 015602
Johann Mertens et al 2012 Nanotechnology 23 015501
A J Lockwood et al 2010 Meas. Sci. Technol. 21 075901
Sonja Huclova et al 2012 J. Phys. D: Appl. Phys. 45 025301