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Electron beam synthesis of metal and semiconductor nanoparticles using metal–organic frameworks as ordered precursors

Benjamin W Jacobs1, Ronald J T Houk1, Bryan M Wong1, A Alec Talin2 and Mark D Allendorf1

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We demonstrate a versatile, bottom-up method of forming metal and semiconducting nanoparticles by exposing precursor metal–organic frameworks (MOFs) to an electron beam. Using a transmission electron microscope to initiate and observe growth, we show that the composition, size, and morphology of the nanoparticles are determined by the chemistry and structure of the MOF, as well as the electron beam properties. Zinc oxide, metallic indium and copper particles were produced with narrow and tunable size distributions comparable to those obtained from state-of-the-art methods. This method represents a first step toward the fabrication of nanoscale heterostructures using the highly controlled environment of the MOF pores as a scaffold or template.


PACS

81.07.Bc Nanocrystalline materials

61.05.J- Electron diffraction and scattering

07.78.+s Electron, positron, and ion microscopes; electron diffractometers

68.37.Lp Transmission electron microscopy (TEM)

61.80.Fe Electron and positron radiation effects

Subjects

Instrumentation and measurement

Surfaces, interfaces and thin films

Condensed matter: structural, mechanical & thermal

Nanoscale science and low-D systems

Dates

Issue 37 (16 September 2011)

Received 18 May 2011, in final form 16 July 2011

Published 18 August 2011



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