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Reduction and oxidation of oxide ion conductors with conductive atomic force microscopy

Wonyoung Lee1, Minhwan Lee1, Young-Beom Kim1 and Fritz B Prinz1,2

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Local accumulation and dissipation of charges on the surface of oxide ion conductors resulting from electric potentials were observed with conductive atomic force microscopy (AFM). After a negative bias was applied at the tip, a sequence of surface potential maps appeared compatible with electron injection onto the electrolyte surface. Applying a positive bias, in contrast, generated a positive surface charge adjacent to the tip contact area. This observation is consistent with the formation of oxide ion vacancies on the oxide surface. In addition, oxide ion conductivity at a low temperature range (100–200 °C) was obtained, and the activation energy for diffusion in gadolinia-doped ceria (GDC) was calculated as ~0.56 eV, implying that the majority of oxide ion vacancies diffuse on the surface rather than inside the bulk of the electrolyte.


PACS

66.30.H- Self-diffusion and ionic conduction in nonmetals

68.37.Ps Atomic force microscopy (AFM)

81.65.Mq Oxidation

61.72.J- Point defects and defect clusters

82.45.Gj Electrolytes

Subjects

Surfaces, interfaces and thin films

Condensed matter: structural, mechanical & thermal

Chemical physics and physical chemistry

Dates

Issue 44 (4 November 2009)

Received 16 April 2009, in final form 13 July 2009

Published 7 October 2009



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