Wonyoung Lee et al 2009 Nanotechnology 20 445706 doi:10.1088/0957-4484/20/44/445706
Reduction and oxidation of oxide ion conductors with conductive atomic force microscopy
Wonyoung Lee1, Minhwan Lee1, Young-Beom Kim1 and Fritz B Prinz1,2
Show affiliationsLocal accumulation and dissipation of charges on the surface of oxide ion conductors resulting from electric potentials were observed with conductive atomic force microscopy (AFM). After a negative bias was applied at the tip, a sequence of surface potential maps appeared compatible with electron injection onto the electrolyte surface. Applying a positive bias, in contrast, generated a positive surface charge adjacent to the tip contact area. This observation is consistent with the formation of oxide ion vacancies on the oxide surface. In addition, oxide ion conductivity at a low temperature range (100–200 °C) was obtained, and the activation energy for diffusion in gadolinia-doped ceria (GDC) was calculated as ~0.56 eV, implying that the majority of oxide ion vacancies diffuse on the surface rather than inside the bulk of the electrolyte.
- PACS
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66.30.H- Self-diffusion and ionic conduction in nonmetals
68.37.Ps Atomic force microscopy (AFM)
- Subjects
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Surfaces, interfaces and thin films
- Dates
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Issue 44 (4 November 2009)
Received 16 April 2009, in final form 13 July 2009
Published 7 October 2009
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Reduction and oxidation of oxide ion conductors with conductive atomic force microscopy
Wonyoung Lee et al 2009 Nanotechnology 20 445706
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J E Hirsch 2008 J. Phys.: Condens. Matter 20 235233
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