G F Sun et al 2009 Nanotechnology 20 355701 doi:10.1088/0957-4484/20/35/355701
G F Sun1,2, J F Jia1,3, Q K Xue1,3 and L Li2
Show affiliationsRidges are observed on epitaxial graphene on 6H-SiC(0001) by scanning tunneling microscopy (STM). Atomic resolution imaging reveals that they are in fact bulged regions of the graphene layer, occurring as a result of bending and buckling to relieve the compressive strain. Furthermore, their length, direction, and distribution can be manipulated, and new ones can even be created by the tip–surface interactions during STM imaging. The lower limit of terrace size for ridge formation is estimated to be ~80 nm, and nearly ridge-free graphene film can be obtained on vicinal 3.5° miscut substrates.
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.60.Bs Mechanical and acoustical properties
62.25.-g Mechanical properties of nanoscale systems
Surfaces, interfaces and thin films
Issue 35 (2 September 2009)
Received 12 June 2009, in final form 15 June 2009
Published 12 August 2009
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