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Molecular beam epitaxial growth and characterization of non-tapered InN nanowires on Si(111)

Yi-Lu Chang, Feng Li, Arya Fatehi and Zetian Mi

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We have performed a detailed investigation of the molecular beam epitaxial growth and characterization of InN nanowires spontaneously formed on Si(111) substrates under nitrogen rich conditions. By employing an in situ deposited thin (~0.5 nm) In seeding layer prior to growth initiation, we have achieved, for the first time, non-tapered epitaxial InN nanowires, which exhibit record narrow spectral linewidths of 14 and 40 meV at 5 K and 300 K, respectively. Detailed studies confirm that the wires are nearly free of dislocations and stacking faults. The achievement of non-tapered, nearly homogeneous InN nanowires also enables, for the first time, the derivation of the band gap of InN directly from PL spectroscopy in the temperature range of 5–300 K.


PACS

68.65.-k Low-dimensional, mesoscopic, and nanoscale systems: structure and nonelectronic properties

78.67.-n Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures

81.15.Hi Molecular, atomic, ion, and chemical beam epitaxy

78.55.Cr III-V semiconductors

81.07.-b Nanoscale materials and structures: fabrication and characterization

81.16.-c Methods of nanofabrication and processing

Subjects

Condensed matter: electrical, magnetic and optical

Semiconductors

Surfaces, interfaces and thin films

Nanoscale science and low-D systems

Dates

Issue 34 (26 August 2009)

Received 30 April 2009, in final form 10 July 2009

Published 4 August 2009



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