Oleg S Ovchinnikov et al 2009 Nanotechnology 20 255701 doi:10.1088/0957-4484/20/25/255701
Oleg S Ovchinnikov1, S Jesse2 and S V Kalinin2
Show affiliationsAn adaptive scanning method in scanning probe microscopy (SPM) is developed for studies of surfaces with a highly-non-uniform information density such as nanowires or interfaces in disordered media. In path-engineered SPM, the surface is pre-scanned to locate features, and a secondary scan is acquired with the pixel density concentrated in the vicinity of the objects of interest. Here, we demonstrate this approach for piezoresponse force microscopy, and develop approaches for fractal and self-affine characterization of domain interfaces. The relationship between the variational roughness, structure factor, and correlation functions is established and resolution effects on these parameters are determined.
68.37.Ps Atomic force microscopy (AFM)
61.46.-w Structure of nanoscale materials
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.35.B- Structure of clean surfaces (and surface reconstruction)
Issue 25 (24 June 2009)
Received 17 December 2008, in final form 10 March 2009
Published 3 June 2009
Oleg S Ovchinnikov et al 2009 Nanotechnology 20 255701
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