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Electrical properties of individual ZnO nanowires

M Sakurai1,3, Y G Wang1, T Uemura2 and M Aono1

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The electrical properties of individual ZnO nanowires were investigated for two methods of fabricating nanowire–electrode junctions. The number of carriers in the nanowires was increased by electrostatically doping them by applying a gate voltage. The nanowires were chemically doped by introducing impurities during growth. The Ga-doped nanowires had a linear current–voltage relationship over a wide voltage region. The nanowire–electrode junctions were formed either by using lithography to form electrodes on the nanowire or by using an AFM probe to move a nanowire onto prepared electrodes. With both methods, electrodes made of Ga-doped ZnO were found to make better electrical contact with the nanowire than those made of Ti/Au.


PACS

73.63.Nm Quantum wires

81.16.Nd Nanolithography

68.37.Ps Atomic force microscopy (AFM)

81.07.Vb Quantum wires

Subjects

Surfaces, interfaces and thin films

Nanoscale science and low-D systems

Dates

Issue 15 (15 April 2009)

Received 12 December 2008, in final form 19 February 2009

Published 24 March 2009



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