Elika Saïdi et al 2009 Nanotechnology 20 115703 doi:10.1088/0957-4484/20/11/115703
Elika Saïdi1, Benjamin Samson1, Lionel Aigouy1, Sebastian Volz2, Peter Löw3,4, Christian Bergaud3,4 and Michel Mortier5
Show affiliationsA scanning thermal microscope that uses a fluorescent particle as a temperature probe has been developed. The particle, made of a rare-earth ion-doped fluoride glass, is glued at the extremity of a sharp tungsten tip and scanned on the surface of an electronic device. The temperature of the device is determined by measuring the fluorescence spectrum of the particle at every point on the surface and by comparing the intensity variations of two emission lines. As an example, we will show some images obtained on a nickel stripe 1 µm wide, heated by an electrical current. A good agreement is observed with a simulation of the temperature field on the device.
Issue 11 (18 March 2009)
Received 10 December 2008, in final form 19 January 2009
Published 25 February 2009
Elika Saïdi et al 2009 Nanotechnology 20 115703
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