M Balantekin et al 2008 Nanotechnology 19 085704 doi:10.1088/0957-4484/19/8/085704
Quantitative mechanical characterization of materials at the nanoscale through direct measurement of time-resolved tip–sample interaction forces
M Balantekin, A G Onaran and F L Degertekin
Show affiliationsWe introduce a new method for material characterization at the nanoscale using a recently developed atomic force microscope (AFM) probe. The FIRAT (force sensing integrated readout and active tip) probe is integrated into a commercial AFM system to obtain time-resolved interaction forces (TRIFs) between the probe tip and sample at speeds suitable for nondestructive and fast imaging of material properties. We present a basic interaction model to extract the material elasticity and surface energy. Numerical simulations are performed and compared to the experimental results for three different polymers and a silicon sample. We find that our interaction model does not completely explain the observed long-range surface forces, but it agrees fairly well with the measurements during the tip–sample contact.
- PACS
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68.37.Ps Atomic force microscopy (AFM)
62.25.-g Mechanical properties of nanoscale systems
81.40.Jj Elasticity and anelasticity, stress-strain relations
- Subjects
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Surfaces, interfaces and thin films
- Dates
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Issue 8 (27 February 2008)
Received 8 October 2007, in final form 24 December 2007
Published 4 February 2008
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Quantitative mechanical characterization of materials at the nanoscale through direct measurement of time-resolved tip–sample interaction forces
M Balantekin et al 2008 Nanotechnology 19 085704
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