Santanu Karan and Biswanath Mallik 2008 Nanotechnology 19 495202 doi:10.1088/0957-4484/19/49/495202
Santanu Karan and Biswanath Mallik1
Show affiliationsHigh quality organic–inorganic heterojunction photodiodes based on nanostructured copper (II) phthalocyanine (CuPc) and intrinsic zinc oxide (i-ZnO) have been fabricated. The i-ZnO thin films/layers were grown by RF magnetron sputtering on clean indium tin oxide (ITO) coated glass substrates. These films have been characterized by optical absorption and field emission scanning electron microscopy (FESEM). CuPc thin films deposited at room temperature on i-ZnO have exhibited a change in their surface morphology with the post-deposition annealing temperature under normal atmosphere. The electrical dark conductivity and the photoconductivity of ITO/i-ZnO/CuPc/Au sandwich structures have been measured under various photoexcitation intensities using a xenon light source. The devices have shown excellent reproducibility of their electrical characteristics and high rectification ratios. The highest rectification ratio is nearly 831 calculated above the threshold voltage at room temperature for the sample annealed at 250 °C (i.e. Pc 250). The effects of the annealing temperature of CuPc on the surface morphology, rectification ratio, and optical properties have been discussed.
85.60.Dw Photodiodes; phototransistors; photoresistors
72.40.+w Photoconduction and photovoltaic effects
85.35.-p Nanoelectronic devices
85.60.Bt Optoelectronic device characterization, design, and modeling
Condensed matter: electrical, magnetic and optical
Surfaces, interfaces and thin films
Issue 49 (10 December 2008)
Received 7 July 2008, in final form 13 October 2008
Published 18 November 2008
Santanu Karan and Biswanath Mallik 2008 Nanotechnology 19 495202
A I Mares et al 2007 Nanotechnology 18 265403
Shamik Gupta et al 2009 J. Phys. A: Math. Theor. 42 485002
Bertrand Eynard and Nicolas Orantin 2009 J. Phys. A: Math. Theor. 42 293001
R Johnsen et al 2009 J. Phys.: Conf. Ser. 192 012009
Wim J van der Zande 2009 J. Phys.: Conf. Ser. 192 011001
Wensheng Yan et al 2009 J. Phys.: Conf. Ser. 190 012164
Y H Matsuda et al 2009 J. Phys.: Conf. Ser. 190 012019
N Lütkenhaus and A J Shields 2009 New J. Phys. 11 045005
Sander van den Driesche et al 2009 Meas. Sci. Technol. 20 124015