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Fabrication of sub-25 nm diameter pillar nanoimprint molds with smooth sidewalls using self-perfection by liquefaction and reactive ion etching

Qiangfei Xia and Stephen Y Chou1

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Self-perfection by liquefaction (SPEL) was used to fabricate nanoimprint molds with an array of sub-25 nm diameter pillars (200 nm period), resulting in nearly perfect cylindrical shape and smooth sidewalls. SPEL turned an array of irregularly shaped Cr polygons into an array of nearly perfect circular dots with small diameter. The Cr dot arrays were then transferred to SiO2 or Si pillar arrays by means of reactive ion etching to produce imprint molds. High-fidelity nanoimprint lithography using the pillar molds was also demonstrated.


PACS

81.16.Nd Nanolithography

81.16.Rf Nanoscale pattern formation

81.07.-b Nanoscale materials and structures: fabrication and characterization

64.70.F- Liquid–vapor transitions

81.65.Cf Surface cleaning, etching, patterning

Subjects

Surfaces, interfaces and thin films

Condensed matter: structural, mechanical & thermal

Nanoscale science and low-D systems

Dates

Issue 45 (12 November 2008)

Received 20 July 2008, in final form 2 September 2008

Published 8 October 2008



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