B W Hoogenboom et al 2008 Nanotechnology 19 384019 doi:10.1088/0957-4484/19/38/384019
B W Hoogenboom1, P L T M Frederix2, D Fotiadis3, H J Hug4,5 and A Engel2
Show affiliationsWe have developed an optical cantilever deflection detector with a spot size <3 µm and fm Hz−1/2 sensitivity over a>10 MHz bandwidth. In this work, we demonstrate its potential for detecting small-amplitude oscillations of various flexural and torsional oscillation modes of cantilevers. The high deflection sensitivity of the interferometer is particularly useful for detecting cantilever oscillations in aqueous solutions, enabling us to reach the thermal noise limit in scanning or atomic force microscopy experiments with stiff cantilevers. This has resulted in atomic-resolution images of solid–liquid interfaces and submolecular-resolution images of native membranes.
Issue 38 (24 September 2008)
Received 15 March 2008, in final form 16 June 2008
Published 12 August 2008
B W Hoogenboom et al 2008 Nanotechnology 19 384019
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