Fèlix Casanova et al 2008 Nanotechnology 19 315709 doi:10.1088/0957-4484/19/31/315709
Fèlix Casanova1, Casey E Chiang1, Chang-Peng Li1,2, Igor V Roshchin1,3, Anne M Ruminski4, Michael J Sailor4 and Ivan K Schuller1
Show affiliationsGas adsorption and capillary condensation of organic vapors are studied by optical interferometry, using anodized nanoporous alumina films with controlled geometry (cylindrical pores with diameters in the range of 10–60 nm). The optical response of the film is optimized with respect to the geometric parameters of the pores, for potential performance as a gas sensor device. The average thickness of the adsorbed film at low relative pressures is not affected by the pore size. Capillary evaporation of the liquid from the nanopores occurs at the liquid–vapor equilibrium described by the classical Kelvin equation with a hemispherical meniscus. Due to the almost complete wetting, we can quantitatively describe the condensation for isopropanol using the Cohan model with a cylindrical meniscus in the Kelvin equation. This model describes the observed hysteresis and allows us to use the adsorption branch of the isotherm to calculate the pore size distribution of the sample in good agreement with independent structural measurements. The condensation for toluene lacks reproducibility due to incomplete surface wetting. This exemplifies the relevant role of the fluid–solid (van der Waals) interactions in the hysteretic behavior of capillary condensation.
68.08.De Liquid-solid interface structure: measurements and simulations
Issue 31 (6 August 2008)
Received 14 February 2008, in final form 16 April 2008
Published 24 June 2008
Fèlix Casanova et al 2008 Nanotechnology 19 315709
R. C. Duncan and Hui Li 1997 ApJ 484 720
V A De Lorenci et al 1999 Class. Quantum Grav. 16 3047
Hidetomo Sawai et al. 2008 ApJ 672 465
Vladimir Al Osipov and Eugene Kanzieper 2009 J. Phys. A: Math. Theor. 42 475101
César Briceño et al. 2002 ApJ 580 317
W Prellier et al 2005 J. Phys.: Condens. Matter 17 R803
Thomas E. Harrison et al. 2007 ApJ 656 444
Christian F Ihle et al 2009 Meas. Sci. Technol. 20 125402
T. Rauscher 2003 ApJS 147 403